When an instrument is broken you get no data. Unfortunately, with FT-IR this might not be the case. The instrument might still deliver data and it is up to the analyst to know when the data is good and when it is not. This webcast will focus on instrument issues, how to quickly determine if the instrument might have a problem and how to optimize the data collection to obtain the best quality data.
Gate form
Like what you're reading?
To view the full content, please answer a few questions.
Gated components