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Smaller, faster and more energy-efficient integrated circuitry are the rules of the game in the semiconductor industry, which is constantly evolving and transforming its manufacturing processes.

How do semiconductor device manufacturers get to smaller nanometer nodes and what analytical instrumentation do they require to achieve faster, smaller, more energy-efficient integrated circuitry?

In this webinar, you will learn about recent advancements in impurity testing techniques (multi-quadrupole ICP-MS and tri-range IR), empowering semiconductor device manufacturers with the right tools to transition from 12 to 3 nanometers to ensure contaminant-free products.


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